The Fddd four-circle diffractometer for single-crystal X-ray studies at temperatures down to 9 K

Journal of Applied Crystallography

Volumn 30, Issue 3, 1997, Pages 413-417

  Copley, Royston C B ^a   Goeta, Andrés E ^a   Lehmann, Christian W ^a   Cole, Jason C ^a   Yufit, Dmitrii S ^a   Howard, Judith A K ^a   Archer, John M ^b  

^a DURHAM UNIVERSITY   (United Kingdom)

^b INSTITUT LAUE LANGEVIN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000811975     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889897002525     Document Type: Article

References (11)

1. Allibon, J. R., (1996). MAD Diffractometer Control Software - AlphaVMS Version. Institut Laue-Langevin (DPT/SCI), Grenoble, France.
2. Copley, R. C. B., Goeta, A. E., Howard, J. A. K., Hughes, A. K. & O'Hare, D. (1997). In preparation.
3. Henriksen, K., Larsen, F. K. & Rasmussen, S. E. (1986). J. Appl. Cryst. 19, 390-394.
4. Hughes, A. K., Murphy, V. J. & O'Hare, D. (1994). J. Chem. Soc. Chem. Commun. 163-164.
5. Kottke, T. & Stalke, D. (1993). J. Appl. Cryst. 26, 615-619.
6. Larsen, F. K. (1991). The Application of Charge Density Research to Chemistry and Drug Design, NATO ASI Series, Series B, Vol. 250, edited by G. A. Jeffrey & J. F. Piniella, pp. 187-208. New York: Plenum.
7. Larsen, F. K. (1995) Acta Cryst. B51, 468-182.
8. More, M., Odou, G. & Lefebvre, J. (1987). Acta Cryst. B43, 398-405.
9. Samson, S., Goldish, E. & Dick, C. J. (1980). J Appl. Cryst. 13, 425-432.
10. Will, G., Göbel, H., Sampson, C. F. & Forsyth, J. B. (1972). Phys. Lett. 38A, 207-208.
11. Zobel, D., Luger, P., Dreissig, W. & Koritsanszky, T. (1992). Acta Cryst. B48, 837-848.