Surface plasmon near-field imaging of very thin microstructured polymer layers

Langmuir

Volumn 20, Issue 23, 2004, Pages 10179-10185

  Weeber, Jean Claude ^a   Finot, Eric ^a   Legay, Guillaume ^a   Cathelat, Arnaud ^a   Lacroute, Yvon ^a   Dereux, Alain ^a  

^a UNIVERSITÉ DE BOURGOGNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT REFLECTION; LIGHTING; MICROSTRUCTURE; PHOTONS; POLYMETHYL METHACRYLATES; SCANNING TUNNELING MICROSCOPY; SURFACE PLASMON RESONANCE; THIN FILMS;

ATTENUATED TOTAL REFLECTION (ATR); OPTICAL INTENSITY; PHOTON SCANNING TUNNELING MICROSCOPY (PSTM); SURFACE PLASMON NEAR-FIELD IMAGING;

IMAGING TECHNIQUES;

ILLUMINATION; IMAGES; MICROSCOPY; MICROSTRUCTURE; POLYMETHYL METHACRYLATE; REFLECTION; THIN FILMS;

EID: 9144228804     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la048242q     Document Type: Review

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