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Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals

Volumn 68, Issue 9, 2004, Pages 730-736

Crystal orientation and microstructure of CeO2 thin films grown on biaxially textured metallic substrates

(8) Matsumoto, Kaname a,f Shii, Hideyuki a,f Ichinose, Ataru b,f Adachi, Hiroki a Yoshida, Yutaka c,f Horii, Shigeru d,f Mukaida, Masashi e,f Osamura, Kozo a

a KYOTO UNIVERSITY (Japan)

b CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY (Japan)

c NAGOYA UNIVERSITY (Japan)

d UNIVERSITY OF TOKYO (Japan)

e YAMAGATA UNIVERSITY (Japan)

f JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

Author keywords

Biaxial texture; Cerium oxide; Critical current density; Cube texture; High temperature superconductor; Nickel; Nickel alloy; Preferred orientation; Thin film

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL ORIENTATION; FILM GROWTH; MICROSTRUCTURE; NICKEL; NICKEL ALLOYS; PULSED LASER DEPOSITION; SUBSTRATES; SUPERCONDUCTING MATERIALS; THIN FILMS;

BIAXIAL TEXTURE; CERIUM OXIDE; CUBE TEXTURE; HIGH-TEMPERATURE SUPERCONDUCTORS; PREFERRED ORIENTATION;

CERIUM COMPOUNDS;

EID: 9144225611 PISSN: 00214876 EISSN: None Source Type: Journal
DOI: 10.2320/jinstmet.68.730 Document Type: Article

Times cited : (2)

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