Characterization of thin-film surfaces by fractal geometry

Fresenius' Journal of Analytical Chemistry

Volumn 358, Issue 1-2, 1997, Pages 119-121

  Zahn, W ^a   Zosch A ^a  

^a Westsachsische Hochschule Zwickau   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038064719     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050360     Document Type: Article

References (10)

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6. Zahn W, Wuttke W, Zösch A (1995) Fresenius J Anal Chem 353:364-368
7. Zösch A, Feyer M, Reinhold Ch, Schröter E, Wuttke W, Pohl M (1995) Proceedings of the Symposium "Keramische Schichten" of the "Gemeinschaftsausschuss Hochleistungskeramik" of DKG and DGM, Koblenz
8. Thornton J (1975) J Vac Sci Technol 12:830-835
9. Mandelbrot B et al (1984) Nature 308:721-722
10. Peitgen O et al (1992) Bausteine des Chaos - Fraktale. Springer Berlin Heidelberg New York