Low-frequency MTF estimation for digital imaging devices using slanted edge analysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5294, Issue , 2004, Pages 93-101

  Williams, Don ^a   Burns, Peter D ^a  

^a EASTMAN KODAK COMPANY   (United States)

Author keywords

Flare; MTF; Slanted edge

Indexed keywords

FREQUENCIES; IMAGE ANALYSIS; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; OPTICAL VARIABLES MEASUREMENT; SCANNING;

FLARES; INTEGRATING CAVITY EFFECTS (ICE); MTF; SLANTED EDGES;

OPTICAL TRANSFER FUNCTION;

EID: 8844265214     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.532405     Document Type: Conference Paper

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