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Volumn , Issue , 2002, Pages 191-195

Refined Slanted-Edge Measurement for Practical Camera and Scanner Testing

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; ERROR ANALYSIS; ESTIMATION; IMAGE ANALYSIS; OPTICAL RESOLVING POWER; OPTICAL TRANSFER FUNCTION; SCANNING; SHOT NOISE; STANDARDS; STATISTICAL METHODS;

EID: 1542272452     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (53)

References (10)
  • 1
    • 1542303620 scopus 로고    scopus 로고
    • Benchmarking of the ISO 12233 Slanted-edge Spatial Frequency Response Plug-in
    • IS&T
    • D. Williams, Benchmarking of the ISO 12233 Slanted-edge Spatial Frequency Response Plug-in, Proc. PICS Conf., IS&T, pg. 133 (1998).
    • (1998) Proc. PICS Conf. , pp. 133
    • Williams, D.1
  • 2
    • 1542273468 scopus 로고    scopus 로고
    • Influence of Image Enhancement Processing on SFR of Digital Cameras
    • IS&T
    • Y. Okano, Influence of Image Enhancement Processing on SFR of Digital Cameras, Proc. PICS Conf., IS&T, pg. 74 (1998).
    • (1998) Proc. PICS Conf. , pp. 74
    • Okano, Y.1
  • 3
    • 1542272661 scopus 로고    scopus 로고
    • Slanted-Edge MTF for Digital Camera and Scanner Analysis
    • IS&T
    • P. D. Burns, Slanted-Edge MTF for Digital Camera and Scanner Analysis, Proc. PICS Conf., IS&T, pg. 135 (2000).
    • (2000) Proc. PICS Conf. , pp. 135
    • Burns, P.D.1
  • 4
    • 1542272669 scopus 로고    scopus 로고
    • A Simple Method for Mearurement of Modulation Transfer Functions of Displays
    • IS&T
    • S. Triantaphillidou, and R. E. Jacobson, A Simple Method for Mearurement of Modulation Transfer Functions of Displays, Proc. PICS Conf., IS&T, pg. 139 (2000).
    • (2000) Proc. PICS Conf. , pp. 139
    • Triantaphillidou, S.1    Jacobson, R.E.2
  • 7
    • 1542287786 scopus 로고    scopus 로고
    • Software available at http://www.pima.net/standards/iso/tc42/wg18/kp_sfr_measure.htm
  • 9
    • 1542303487 scopus 로고    scopus 로고
    • Using Slanted Edge Analysis for Color Registration Measurement
    • IS&T
    • P. D. Burns, and D. Williams, Using Slanted Edge Analysis for Color Registration Measurement, Proc. PICS Conf., IS&T, pg. 51 (1999).
    • (1999) Proc. PICS Conf. , pp. 51
    • Burns, P.D.1    Williams, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.