A comparison of statistical methods for evaluating matching performance of a biometric identification device- A preliminary report

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5404, Issue , 2004, Pages 144-155

  Schuckers, Michael E ^a,b   Hawley, Anne ^c   Livingstone, Katie ^a   Mramba, Nona ^a  

^a ST LAWRENCE UNIVERSITY   (United States)

^b WEST VIRGINIA UNIVERSITY   (United States)

^c NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Beta binomial; Bootstrap; False accept rate; False reject rate; Intra individual correlation; Logit transformation; Method of moments

Indexed keywords

BETA-BIONOMIAL; BOOTSTRAP; FALSE ACCEPT RATE; FALSE REJECT RATE; INTRA-INDIVIDUAL CORRELATION; LOGIT TRANSFORMATION;

CORRELATION METHODS; DATA REDUCTION; ERROR ANALYSIS; METHOD OF MOMENTS; PARAMETER ESTIMATION; STATISTICAL METHODS;

PATTERN RECOGNITION;

EID: 8844232836     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.541899     Document Type: Conference Paper

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