Using the beta-binomial distribution to assess performance of a biometric identification device

International Journal of Image and Graphics

Volumn 3, Issue 3, 2003, Pages 523-529

  Schuckers, Michael E ^a,b  

^a ST LAWRENCE UNIVERSITY   (United States)

^b WEST VIRGINIA UNIVERSITY   (United States)

Author keywords

FMR; FNMR; maximum likelihood; statistical estimation

Indexed keywords

ANTHROPOMETRY; BIOMETRICS; FERROMAGNETIC RESONANCE; MAXIMUM LIKELIHOOD;

BETA-BINOMIAL DISTRIBUTIONS; BIOMETRIC IDENTIFICATIONS; CONFIDENCE INTERVAL; FALSE NON MATCH RATE; FNMR; MATCHING PERFORMANCE; REGULARITY CONDITION; STATISTICAL ESTIMATION;

MAXIMUM LIKELIHOOD ESTIMATION;

EID: 8844272108     PISSN: 02194678     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219467803001147     Document Type: Article

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