Gaussian scaling for the critical spread-out contact process above the upper critical dimension

Electronic Journal of Probability

Volumn 9, Issue , 2004, Pages 710-769

  van der Hofstad, Remco ^a   Sakai, Akira ^b  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b EURANDOM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 8744247449     PISSN: None     EISSN: 10836489     Source Type: Journal    
DOI: 10.1214/EJP.v9-224     Document Type: Article

References (34)

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