Critical exponents for the contact process under the triangle condition

Journal of Statistical Physics

Volumn 91, Issue 1-2, 1998, Pages 95-124

  Barsky, David J ^a   Wu, C Chris ^b  

^a CALIFORNIA STATE UNIVERSITY   (United States)

^b Penn State University ^*  (United States)

Author keywords

Contact process; Critical exponent; Triangle condition; Upper critical dimension

Indexed keywords

EID: 0032047357     PISSN: 00224715     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1023036020125     Document Type: Article

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