Temporal speckle pattern interferometry for measuring micron-order surface motion of a liquid bridge

Measurement Science and Technology

Volumn 15, Issue 11, 2004, Pages 2284-2294

  Li, Xinbo ^a   Nishino, Koichi ^a   Yoda, Shin Ichi ^b  

^a YOKOHAMA NATIONAL UNIVERSITY   (Japan)

^b JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

Author keywords

Dynamic surface displacement; Electronic speckle pattern interferometry; Liquid bridge; Temporal speckle pattern interferometry

Indexed keywords

GLASS; INTERFEROMETRY; LIQUID CHROMATOGRAPHY; OPTICAL PHASE CONJUGATION;

TEMPORAL SPECKLE PATTERN INTERFEROMETRY (TSPI); TIME SEQUENCE PHASE METHOD (TSPM);

PATTERN RECOGNITION;

MEASUREMENT METHOD;

EID: 8644274581     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/15/11/014     Document Type: Article

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