Commercial silicon nitride powders surface groups measured by diffuse reflectance infrared fourier transform spectroscopy

Key Engineering Materials

Volumn 264-268, Issue II, 2004, Pages 1119-1122

  Hien, T T T ^b   Ishizaki, C ^c   Ishizaki, K ^a  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^b Dai Hoc Bach Khoa Ha Noi   (Viet Nam)

^c Si nano Technology Corporation   (Japan)

Author keywords

Commercial silicon nitride; Diffuse reflectance infrared Fourier transform (DRIFT) spectroscopy; NHx; OH; Powder; SiHx absorbance bands

Indexed keywords

COMPUTATIONAL METHODS; GAS ABSORPTION; NITROGEN COMPOUNDS; POWDERS; PRECIPITATION (CHEMICAL); REDUCTION; REFLECTION; SPECTROSCOPIC ANALYSIS;

COMMERCIAL SILICON NITRIDE; DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM (DRIFT) SPECTROSCOPY; NHX; POWDER; SIHX ABSORBANCE BANDS;

SILICON NITRIDE;

EID: 8644274189     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (6)

1. T. T. T. Hien, Ch. Ishizaki and K. Ishizaki: J. Ceram. Soc. Jpn, Vol. 111 [1] (2003), pp. 28-32.
2. 4 Powders Analyzed by Diffuse Reflectance Infrared Fourier Transform Spectroscopy" submitted in J. Ceram. Soc. Jpn, (2003).
3. T. Nakamatsu, Ch. Ishizaki and K. Ishizaki: Ceramic Engineering and Science Proceeding, published by American Ceramic Society, Vol. 19 [3] (1998), pp. 3-10.
4. T. Nakamatsu, N. Saito and K. Ishizaki: Advances in Tech. Mater, and Mater. Proc. J. (ATM), Vol. 2 [1] (2000), pp. 42-53.
5. T. Nakamatsu, N. Saito, Ch. Ishizaki and K. Ishizaki: J. Euro. Ceram. Soc., Vol. 18 (1998), pp. 1273-1279.
6. E. Busterret, M. Bensouda, M. C. Habrard, J. C. Bruyere, S. Poulin and S. C. Gujrathi: Physical Review B, Vol. 38 [12] (1988), pp. 8171-8184.