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Solid State Phenomena

Volumn 99-100, Issue , 2004, Pages 265-268

Studies of multiwall carbon nanotubes using raman spectroscopy and atomic force microscopy

(5) Zdrojek, M a Gebicki, W a Jastrzebski, C a Melin, T b Huczko, A c

a WARSAW UNIVERSITY OF TECHNOLOGY (Poland)

b INSTITUT D ELECTRONIQUE (France)

c UNIVERSITY OF WARSAW (Poland)

Author keywords

AFM; Multiwall carbon nanotubes; Raman spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON RESONANCE; RAMAN SPECTROSCOPY; SPECTROMETERS; NANOTUBES; RAMAN SCATTERING; SINGLE-WALLED CARBON NANOTUBES (SWCN);

MULTIWALL CARBON NANOTUBES (MWCNT); PHONON DENSITY; RAMAN RESONANCE EFFECTS; WAVELENGTH EXCITATIONS; DISORDER EFFECT; LOW FREQUENCY BAND; MICRO-RAMAN SPECTRA; RADIAL BREATHING MODE; RAMAN BANDS; RAMAN SCATTERING MEASUREMENTS; SINGLE WALL NANOTUBES;

CARBON NANOTUBES; MULTIWALLED CARBON NANOTUBES (MWCN);

EID: 8644230999 PISSN: 10120394 EISSN: None Source Type: Book Series
DOI: 10.4028/www.scientific.net/ssp.99-100.265 Document Type: Conference Paper

Times cited : (103)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.