ANALYSIS OF DATA FROM AN ADMISSIONS TEST WITH ITEM MODELS

ETS Research Report Series

Volumn 2005, Issue 1, 2005, Pages i-32

  Sinharay, Sandip ^a   Johnson, Matthew ^b  

^a EDUCATIONAL TESTING SERVICE   (United States)

^b CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

bayesian hierarchical model; expected response function; item family; item model

Indexed keywords

EID: 85164475421     PISSN: None     EISSN: 23308516     Source Type: Journal    
DOI: 10.1002/j.2333-8504.2005.tb01983.x     Document Type: Article

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