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Volumn , Issue , 2001, Pages

Real-Time Characterization and Optimization of E-Beam Evaporated Optical Coatings

Author keywords

[No Author keywords available]

Indexed keywords

FIBER OPTIC SENSORS; HAFNIUM OXIDES; LIGHT INTERFERENCE;

EID: 85135907531     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (21)
  • 2
    • 0030269547 scopus 로고    scopus 로고
    • Application of the needle optimization technique to the design of optical coatings
    • A. V. Tikhonravov, M. K. Trubetskov, and G. DeBell, “Application of the needle optimization technique to the design of optical coatings," Appl. Opt. 35, 5493-5508 (1996).
    • (1996) Appl. Opt , vol.35 , pp. 5493-5508
    • Tikhonravov, A. V.1    Trubetskov, M. K.2    DeBell, G.3
  • 3
    • 1942464755 scopus 로고    scopus 로고
    • Design and reverse engineering of optical coatings
    • OSA Technical Digest Series 9, (Optical Society of America, Washington DC)
    • A. V. Tikhonravov, “Design and reverse engineering of optical coatings," In Optical Interference Coatings, OSA Technical Digest Series 9, 300-301 (Optical Society of America, Washington DC, 1998).
    • (1998) Optical Interference Coatings , pp. 300-301
    • Tikhonravov, A. V.1
  • 5
    • 0018483224 scopus 로고
    • Optical thin film production with continuous reoptimization of layer thicknesses
    • C. Holm, “Optical thin film production with continuous reoptimization of layer thicknesses," Appl. Opt. 18, 1978-1982 (1979).
    • (1979) Appl. Opt , vol.18 , pp. 1978-1982
    • Holm, C.1
  • 7
    • 84975538984 scopus 로고
    • Wideband monitoring and measuring system for optical coatings
    • L. Li and Y.-H. Yen, “Wideband monitoring and measuring system for optical coatings," Appl. Opt. 28, 2889-2894 (1989).
    • (1989) Appl. Opt , vol.28 , pp. 2889-2894
    • Li, L.1    Yen, Y.-H.2
  • 8
    • 84975635030 scopus 로고
    • Deposition error compensation for optical multilayer coatings: I. Theoretical description
    • B. T. Sullivan and J. A. Dobrowolski, “Deposition error compensation for optical multilayer coatings: I. Theoretical description," Appl. Opt. 31, 3821-3835 (1992).
    • (1992) Appl. Opt , vol.31 , pp. 3821-3835
    • Sullivan, B. T.1    Dobrowolski, J. A.2
  • 9
    • 77949408973 scopus 로고
    • Deposition of optical multilayer coatings with automatic error compensation: II. Magnetron sputtering
    • B. T. Sullivan and J. A. Dobrowolski, “Deposition of optical multilayer coatings with automatic error compensation: II. Magnetron sputtering," Appl. Opt. 32, 2351-2360 (1993).
    • (1993) Appl. Opt , vol.32 , pp. 2351-2360
    • Sullivan, B. T.1    Dobrowolski, J. A.2
  • 17
    • 85166703410 scopus 로고    scopus 로고
    • A wideband optical monitor for a planetary-rotation coating-system
    • (Optical Society of America, Washington DC)
    • M. B. Campanelli and D. J. Smith, “A wideband optical monitor for a planetary-rotation coating-system," In Optical Interference Coatings, OSA Technical Digest Series 9, 426-428 (Optical Society of America, Washington DC, 1998).
    • (1998) Optical Interference Coatings, OSA Technical Digest Series , vol.9 , pp. 426-428
    • Campanelli, M. B.1    Smith, D. J.2
  • 18
    • 0020204060 scopus 로고
    • Automatic determination of optical constants of inhomogeneous thin films
    • J. P. Borgogno, B. Lazarides, and E. Pelletier, “Automatic determination of optical constants of inhomogeneous thin films," Appl. Opt. 21, 4020-4029 (1982).
    • (1982) Appl. Opt , vol.21 , pp. 4020-4029
    • Borgogno, J. P.1    Lazarides, B.2    Pelletier, E.3
  • 21
    • 33645287891 scopus 로고
    • Second order optimization methods in the synthesis of multilayer coatings
    • A. N. Tikhonov, A. V. Tikhonravov, and M. K. Trubetskov, “Second order optimization methods in the synthesis of multilayer coatings," Comp. Maths. Math. Phys. 33, 1339-1352 (1993).
    • (1993) Comp. Maths. Math. Phys , vol.33 , pp. 1339-1352
    • Tikhonov, A. N.1    Tikhonravov, A. V.2    Trubetskov, M. K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.