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Volumn , Issue , 2008, Pages 1-333

Platform interference in wireless systems: Models, measurement, and mitigation

(2)  Slattery, Kevin a   Skinner, Harry a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords


EID: 85133263190     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-0-7506-8757-7.X5001-8     Document Type: Book
Times cited : (36)

References (98)
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    • (Nicely done presentation; the physics is developed along with the mathematics.), University of Chicago Press
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    • 85133259306 scopus 로고    scopus 로고
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    • K. Slattery, J. Muccioli, T. North, Modeling the Radiated Emissions from Microprocessors and Other VLSI Devices, IEEE 2000 EMC Symposium, Washington, DC.
    • Slattery, K.1    Muccioli, J.2    North, T.3
  • 92
    • 84882074963 scopus 로고    scopus 로고
    • EMC Design for Compliance: Conductive Coatings
    • (Conformity Whitepaper).
    • W.D. Kimmel, and D.D. Gerke, EMC Design for Compliance: Conductive Coatings (Conformity Whitepaper).
    • Kimmel, W.D.1    Gerke, D.D.2
  • 93
    • 85133230056 scopus 로고    scopus 로고
    • Microwave Absorbers: Reducing Cavity Resonances
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    • MMSE Noise Power and SNR Estimation for OFDM Systems. (Whitepaper
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    • T. Yucek and H. Arslan, MMSE Noise Power and SNR Estimation for OFDM Systems. (Whitepaper, University of South Florida).
    • Yucek, T.1    Arslan, H.2
  • 96
    • 84882147066 scopus 로고    scopus 로고
    • Adaptive Bit Loading for Wireless OFDM Systems. IBM Zurich Research Laboratory
    • Ruschlikon, Switzerland
    • A.N. Barreto and S. Furrer, Adaptive Bit Loading for Wireless OFDM Systems. IBM Zurich Research Laboratory, Ruschlikon, Switzerland.
    • Barreto, A.N.1    Furrer, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.