Core Level XPS Spectra of Elemental Silicon Using Zirconium Radiation

Surface Science Spectra

Volumn 5, Issue 2, 1998, Pages 115-121

  Chourasia, A R ^a  

^a TEXAS A AND M UNIVERSITY COMMERCE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; AUGERS; SILICON; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER PARAMETERS; DATA SET; ELEMENTAL SILICON; X-RAY PHOTOELECTRONS; XPS DATA; XPS SPECTRUM;

ZIRCONIUM;

EID: 85116906567     PISSN: 10555269     EISSN: 15208575     Source Type: Journal    
DOI: 10.1116/1.1247869     Document Type: Article

References (2)

1. A. R.Chourasia, S. J.Hood, and D. R.Chopra, J. Vac. Sci. Technol. A 14, 699 (1996). 10.1116/1.580374
2. J. F.Moulder, W. F.Stickle, P. E.Sobol, and K. D.Bomben, Handbook of X-ray Photoelectron Spectroscopy (Physical Electronics, Eden Prairie, MN, 1992).