A study of Si compounds by Zr Lα photoelectron spectroscopy

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 14, Issue 3, 1996, Pages 699-703

  Chourasia, A R ^a   Hood, S J ^a   Chopra, D R ^a  

^a TEXAS A AND M UNIVERSITY COMMERCE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001930424     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580374     Document Type: Article

References (15)

1. J. Finster, E. D. Klinkenberg, and J. Heeg, Vacuum 41, 1586 (1990).
2. J. E. Castle, L. B. Hazell, and R. H. West, J. Electron Spectrosc. Relat. Phenom. 16, 97 (1979).
3. J. Finster, Surf. Interface Anal. 12, 309 (1988).
4. L. Zambov, G. Peev, V. Shanov, and S. Drumeva, Vacuum 43, 227 (1992).
5. J. C. Riviere, J. A. A. Crossley, and B. A. Saxton, J. Appl. Phys. 64, 4585 (1988).
6. R. H. West and J. E. Castle, Surf. Interface Anal. 4, 68 (1982).
7. J. C. Riviere and J. A. A. Crossley, Surf. Interface Anal. 8, 173 (1986).
8. Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, edited by D. Briggs and M. P. Seah (Wiley, New York, 1983).
9. C. D. Wagner, Anal. Chem. 44, 972 (1972).
10. D. A. Shirley, Chem. Phys. Lett. 17, 312 (1972); Phys. Rev. A 7, 1520 (1973).
11. D. A. Shirley, Chem. Phys. Lett. 17, 312 (1972); Phys. Rev. A 7, 1520 (1973).
12. C. D. Wagner and J. A. Joshi, J. Electron Spectrosc. Relat. Phenom. 47, 283 (1988).
13. L. Pauling, The Nature of the Chemical Bond, 3rd ed. (Cornell University Press, New York, 1960).
14. A. E. T. Kuiper, S. W. Koo, F. H. P. M. Habraken, and Y. Tamminga, J. Vac. Sci. Technol. B 1, 62 (1983).
15. D. A. G. Bruggeman, Ann. Phys. Leipzig 24, 636 (1935).