High Resolution XPS Study of a Thin Cr2O3(111) Film Grown on Cr(110)

Surface Science Spectra

Volumn 4, Issue 3, 1996, Pages 246-252

  Hassel, M ^a   Hemmerich, I ^a   Kuhlenbeck, H ^b   Freund, H J ^b  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CATALYST ACTIVITY; CHROMIUM COMPOUNDS; ELECTRONIC STRUCTURE; FILM PREPARATION; LOW ENERGY ELECTRON DIFFRACTION; OXIDE FILMS; SINGLE CRYSTALS; TRANSITION METALS; X RAY PHOTOELECTRON SPECTROSCOPY;

ACTIVE COMPONENTS; HETEROGENOUS CATALYSIS; HIGH RESOLUTION; IN-SITU OXIDATION; MATERIAL COMPONENTS; MEASUREMENTS OF; SUPPORTING MATERIAL; SURFACE ELECTRONIC STRUCTURES; TRANSITION-METAL OXIDES; XPS MEASUREMENTS;

ELECTRONS;

EID: 85116883646     PISSN: 10555269     EISSN: 15208575     Source Type: Journal    
DOI: 10.1116/1.1247795     Document Type: Article

References (3)

1. H.Kuhlenbeck, C.Xu, B.Dillmann, M.Hassel, B.Adam, D.Ehrlich, S.Wohlrab, H.-J.Freund, U. A.Ditzinger, H.Neddermeyer, M.Neuber, and M.Neumann, Ber. Bunsenges Phys. Chem. 96, 15 (1992). 10.1002/bbpc.19920960104
2. F.Rohr, M.Beumer, H.-J.Freund, J. A.Mejias, V.Staemmler, S.Moeller, L.Hammer, and K.Heinz, Surf. Sci. Lett. 372, L291 (1997). 10.1016/S0039-6028(96)01255-1
3. M. P.Seah and W. A.Dench, Surf. Interface Anal. 1, 1 (1979).