Quantized behavior of the LIDT in the fs-range in dielectric layers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5647, Issue , 2005, Pages 53-60

  Jupe M ^a   Jensen, L ^a   Starke, K ^a   Ristau, D ^a   Melninkaitis, A ^b   Grigonis, R ^b   Sirutkaitis, V ^b  

^a LASER ZENTRUM HANNOVER E V   (Germany)

^b VILNIUS UNIVERSITY   (Lithuania)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC MATERIALS; IONIZATION; IRRADIATION; LASER PULSES; LIGHT ABSORPTION; MATHEMATICAL MODELS; PROBABILITY;

DIELECTRIC LAYERS; IONIZATION PROCESS; OPTICAL COMPONENT; PHOTON ABSORPTION;

LASER DAMAGE;

EID: 18744380698     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.597993     Document Type: Conference Paper

References (13)

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