Reverse engineering of fabricated coatings using off-line and on-line photometric data

Optics InfoBase Conference Papers

Volumn , Issue , 2007, Pages

  Tikhonravov, Alexander V ^a   Trubetskov, Michael K ^a   Kokarev, Michael A ^a   Thöny, Silvia Schwyn ^b  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b SwissOptic AG   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

FIBER OPTIC SENSORS; LIGHT INTERFERENCE; REVERSE ENGINEERING;

COATING LAYER; ONLINE MONITORING; PHOTOMETRIC DATA;

COATINGS;

EID: 85086612719     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: 10.1364/oic.2007.wa3     Document Type: Conference Paper

References (5)

1. A. V. Tikhonravov, "Design and reverse engineering of optical coatings," in Optical Interference Coatings, Vol. 9 of OSA Technical Digest Series (Optical Society of America, Washington DC, Tucson, 1998), pp. 300-301.
2. A. V. Tikhonravov and M. K. Trubetskov, "On-line characterization and reoptimization of optical coatings," SPIE Proceedings 5250, 406-413 (2004).
3. H. A. Macleod, Thin film optical filters (McGraw-Hill, New York, 1986).
4. S. Furman and A. V. Tikhonravov, Basics of Optics of Multilayer Systems (http://www.optilayer.com, 1992).
5. A. Tikhonravov and M. Trubetskov, "Eliminating of cumulative effect of thickness errors in monochromatic monitoring of optical coating production: theory," Appl. Opt. (2007), doc. ID 74972 (posted 01 December 2006, in press).