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Volumn , Issue , 2009, Pages
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Fourier analysis and synthesis tomography: Dynamic measurement of 2D and 3D structure
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Author keywords
[No Author keywords available]
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Indexed keywords
FOURIER ANALYSIS;
PIXELS;
3D STRUCTURE;
ANALYSIS AND SYNTHESIS;
DYNAMIC MEASUREMENT;
FULL-FIELD IMAGING;
INTERFERENCE PATTERNS;
PROJECTED DYNAMICS;
SINGLE PIXEL;
SPATIAL SPECTRA;
TOMOGRAPHY;
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EID: 85085401178
PISSN: None
EISSN: 21622701
Source Type: Conference Proceeding
DOI: 10.1364/ntm.2009.nwa3 Document Type: Conference Paper |
Times cited : (1)
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References (10)
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