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Volumn , Issue , 2009, Pages

Fourier analysis and synthesis tomography: Dynamic measurement of 2D and 3D structure

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER ANALYSIS; PIXELS;

EID: 85085401178     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: 10.1364/ntm.2009.nwa3     Document Type: Conference Paper
Times cited : (1)

References (10)
  • 1
    • 33646713505 scopus 로고
    • Principles of computerized tomographic imaging
    • New York c
    • A.C.Kak, M.Slanley, Principles of computerized tomographic imaging, IEEE Press, New York c.1988
    • (1988) IEEE Press
    • Kak, A.C.1    Slanley, M.2
  • 3
    • 0034028826 scopus 로고    scopus 로고
    • Surpassing the lateral resolution limit by a factor of two using structured illumination
    • Gustafson, M.G.L., Surpassing the lateral resolution limit by a factor of two using structured illumination, J. Microscopy 198, 82-87 (2000)
    • (2000) J. Microscopy , vol.198 , pp. 82-87
    • Gustafson, M.G.L.1
  • 4
    • 24044525601 scopus 로고    scopus 로고
    • Synthetic aperture superresolution by speckle pattern projection
    • García, J., Zalevsky, Z., and Fixler, D. Synthetic aperture superresolution by speckle pattern projection, Optics Express 13, 6073 (2005)
    • (2005) Optics Express , vol.13 , pp. 6073
    • García, J.1    Zalevsky, Z.2    Fixler, D.3
  • 5
    • 78650496022 scopus 로고
    • Microscope for producing high resolution images without precision optics
    • U.S. Patent 5,584,484
    • Hutchin, R.A., Microscope for producing high resolution images without precision optics, U.S. Patent, 5,584,484, 1986.
    • (1986)
    • Hutchin, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.