An all-digital A/D converter for increased resolution with a 2 -delay-unit ‘7'7 TAD architecture using moving-average filtering

Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003

Volumn , Issue , 2003, Pages

  Watanabe, Takamoto ^a   Mizuno, Tamotsu ^a   Terasawa, Tomohito ^a   Masuda, Sumio ^b  

^a DENSO CORPORATION   (Japan)

^b Jeco Co Ltd   (Japan)

Author keywords

ADC; All digital; Moving average

Indexed keywords

DELAY CIRCUITS; LOW PASS FILTERS; SPURIOUS SIGNAL NOISE;

ALL DIGITAL; BASIC STRUCTURE; DIGITAL CORRECTION; FREQUENCY COUNTERS; HIGH-FREQUENCY NOISE; LOW-FREQUENCY NOISE; MOVING AVERAGES; OPERATING PRINCIPLES;

ANALOG TO DIGITAL CONVERSION;

EID: 85084021195     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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