Experimental measurement of the variation in sensitivity within a single pixel of a CCD

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3019, Issue , 1997, Pages 42-49

  Kavaldjiev, Daniel ^a   Ninkov, Zoran ^a  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

CCD; Crosstalk; Pixel sensitivity; Response function

Indexed keywords

CHARGE COUPLED DEVICES; CROSSTALK; PIXELS; SEMICONDUCTOR DETECTORS; SOLID-STATE SENSORS;

DIFFUSION EFFECTS; ILLUMINATED CCD; PHOTON COUNTING SYSTEM; REFLECTION MICROSCOPE; RESPONSE FUNCTIONS; SENSITIVITY VARIATION; SOLID STATE DETECTORS; SPATIAL SCALE;

SENSITIVITY ANALYSIS;

EID: 85075924723     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.275189     Document Type: Conference Paper

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