Functional characterization of surface roughness generated by plateau honing process using wavelet analysis

SAE Technical Papers

Volumn , Issue , 2004, Pages

  Lu, Shengfeng ^a   Iyer, Kaushik ^a   Hu, S Jack ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HONING; SURFACE ROUGHNESS; WAVELET ANALYSIS;

FUNCTIONAL ASPECTS; FUNCTIONAL CHARACTERIZATION; FUNCTIONAL COMPONENTS; FUNCTIONAL PERFORMANCE; MULTI-PROCESSES; PLATEAU HONING; PLATEAU-HONED SURFACE; PROBABILITY PLOT;

WAVELET TRANSFORMS;

EID: 85072438251     PISSN: 01487191     EISSN: 26883627     Source Type: Journal    
DOI: 10.4271/2004-01-1558     Document Type: Conference Paper

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