Understanding the robustness of SSDs under power fault

Proceedings of the 11th USENIX Conference on File and Storage Technologies, FAST 2013

Volumn , Issue , 2013, Pages 271-284

  Zheng, Mai ^a   Tucek, Joseph ^b   Qin, Feng ^a   Lillibridge, Mark ^b  

^a OHIO STATE UNIVERSITY   (United States)

^b HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRIME; DIGITAL STORAGE;

DEVICE FAILURES; FAILURE BEHAVIORS; FAULT INJECTION; NO-SQL DATABASE; STORAGE COMPONENT; STORAGE SYSTEMS; STORAGE TECHNOLOGY; TESTING FRAMEWORK;

OUTAGES;

EID: 85061208594     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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