Simulations of the electrostatic potential distribution in a TEM sample of a semiconductor device

Microscopy of Semiconducting Materials 2003

Volumn , Issue , 2018, Pages 501-504

  Somodi, P K ^a   Dunin Borkowski, R E ^a   Twitchett, A C ^a   Barnes, C H W ^a   Midgley, P A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON HOLOGRAPHY; SEMICONDUCTOR JUNCTIONS;

DIFFERENT BOUNDARY CONDITION; ELECTROSTATIC POTENTIAL DISTRIBUTION; ELECTROSTATIC POTENTIALS; SAMPLE SURFACE; SI P-N JUNCTIONS;

ELECTROSTATICS;

EID: 85053303036     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1201/9781351074636     Document Type: Chapter

References (6)

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3. Lüth H 2001 Solid Surfaces Interfaces and Thin Films (New York, Springer) P 348
4. McCartney M R, Gribelyuk M A, Li J, Ronsheim P, McMurray J S and Smith D J 2002 Appi. Phys. Lett. 80 3213
5. Press W H, Teukolsky S A, Vettering W T and Flannery B P 2002 Numerical Recipes in C-H- (Cambridge, CUP) ch 17
6. Twitchett A C, Dunin-Borkowski R E and Midgley P A 2002 Phys. Rev. Lett. 88 238302