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Volumn , Issue , 2000, Pages 49-119

Surface roughness analysis and measurement techniques

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EID: 85051125255     PISSN: None     EISSN: None     Source Type: Book    
DOI: None     Document Type: Chapter
Times cited : (109)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.