Estimation of matrix-element effects and determination of the Fermi surface in (formula presented) systems using angle-scanned photoemission spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 9, 2001, Pages

  Borisenko, S V ^a   Kordyuk, A A ^a   Legner, S ^a   Durr C ^a   Knupfer, M ^a   Golden, M S ^a   Fink, J ^a   Nenkov, K ^a   Eckert, D ^a   Yang, G ^b   Abell, S ^b   Berger, H ^c   Forro L ^c   Liang, B ^d   Maljuk, A ^d   Lin, C T ^d   Keimer, B ^d  

^a IFW DRESDEN   (Germany)

^b UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^c EPFL   (Switzerland)

^d MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85038267725     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.64.094513     Document Type: Article

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47. The FS maps shown in Fig. 66 show the FS arc around the nodal direction with unprecedented clarity. This fact is due to (i) an intensity enhancement coming from the symmetry selection rules, as in this case the E vector of the ca. 40% linearly polarized component of the He I radiation was aligned perpendicular to the (Formula presented) direction and (ii) the high overall angular resolution for measurement in this direction leading to the large signal to background ratio seen in Fig. 11.
48. MDM normalization using a signal that varies quickly in k space will give unphysical results. This would occur if the normalization signal was a “scaled down version” of the original (Formula presented)-MDM, as could easily be the case taking the intensity above (Formula presented) for finite temperatures.