Crystalline stages of rubrene films probed by Raman spectroscopy

Springer Proceedings in Physics

Volumn 129, Issue , 2009, Pages 37-41

  Paez, B A ^a   Abd Al Baqi, Sh ^b   Sosa, G H ^b   Andreev, A ^a   Winder, C ^a   Padinger, F ^a   Simbrunner, C ^b   Sitter, H ^b  

^a NANOIDENT Technologies AG   (Austria)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DEPOLARIZATION; FILM GROWTH; MICA; MOLECULES; SILICATE MINERALS; THIN FILMS;

AMORPHOUS MATRICES; CRYSTALLINE NATURE; DEPOLARIZATION RATIO; FINGERPRINT FEATURES; HOT-WALL EPITAXY; POLARIZATION DEPENDENCE; RUBRENE THIN FILMS; VIBRATIONAL BANDS;

AMORPHOUS FILMS;

EID: 85028664827     PISSN: 09308989     EISSN: 18674941     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-540-95930-4_6     Document Type: Chapter

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