Assessing risk of a serious failure mode based on limited field data

IEEE Transactions on Reliability

Volumn 64, Issue 1, 2015, Pages 51-62

  Xu, Zhibing ^a   Hong, Yili ^a   Meeker, William Q ^b  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^b Iowa State University   (United States)

Author keywords

Calibration; discrete Fourier transform; failure reporting delay; Poisson binomial distribution; prediction interval; Weibull

Indexed keywords

CALIBRATION; CONSUMER PRODUCTS; DISCRETE FOURIER TRANSFORMS; FORECASTING; POISSON DISTRIBUTION; SENSITIVITY ANALYSIS; STATISTICAL PROCESS CONTROL; WEIBULL DISTRIBUTION;

CUMULATIVE NUMBER; MODELING AND PREDICTIONS; POISSON BINOMIAL DISTRIBUTIONS; PREDICTION INTERVAL; PROBABILITY OF FAILURE; PRODUCT RETIREMENT; STATISTICAL PREDICTION; WEIBULL;

RISK ASSESSMENT;

EID: 85027949744     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2014.2354893     Document Type: Article

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