Semi-markov process-based integrated importance measure for multi-state systems

IEEE Transactions on Reliability

Volumn 64, Issue 2, 2015, Pages 754-765

  Dui, Hongyan ^a   Si, Shubin ^b   Zuo, Ming J ^c,d   Sun, Shudong ^b  

^a ZHENGZHOU UNIVERSITY   (China)

^b NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

^c UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^d UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Component state; importance measure; multi state system; semi Markov processes

Indexed keywords

EQUATIONS OF STATE; FAULT TREE ANALYSIS; MARKOV PROCESSES; NUMERICAL METHODS; RELIABILITY THEORY; WEIBULL DISTRIBUTION;

COMPONENT STATE; CONSTRUCTION IMPROVEMENTS; IMPORTANCE MEASURE; INTEGRATED IMPORTANCE MEASURES; MULTI-STATE SYSTEM; PERFORMANCE BASED; RELIABILITY ENGINEERING; SEMI MARKOV PROCESS;

PROBABILITY DISTRIBUTIONS;

EID: 85027937912     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2015.2413031     Document Type: Article

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