SCOPUS 정보 검색 플랫폼

Journal of Materials Science: Materials in Electronics

Volumn 22, Issue 12, 2011, Pages 1750-1760

Dielectric and impedance spectroscopy study of Ba0.8Bi 2.133Nb1.6Ta0.4O9 ferroelectric ceramics, prepared by chemical route

(4) Dhak, Prasanta a,b Dhak, Debasis c Das, Manasmita d Pramanik, Panchanan a

a INDIAN INSTITUTE OF TECHNOLOGY (India)

b JADAVPUR UNIVERSITY (India)

c Serampore College (India)

d NATIONAL INSTITUTE OF PHARMACEUTICAL EDUCATION AND RESEARCH NIPER (India)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM; CERAMIC MATERIALS; CRYSTALLITE SIZE; FERROELECTRIC CERAMICS; GRAIN BOUNDARIES; NANOCRYSTALS; NIOBIUM; PARTICLE SIZE; POLYMER BLENDS; SCANNING ELECTRON MICROSCOPY; SINTERING; SPECTROSCOPY; X RAY DIFFRACTION;

COMPLEX IMPEDANCE SPECTROSCOPY; GRAIN BOUNDARY EFFECTS; IMPEDANCE SPECTROSCOPY; NANOCRYSTALLINE CERAMICS; POLARIZATION BEHAVIOR; THERMALLY ACTIVATED PROCESS; UNIVERSAL POWER LAW; X-RAY DIFFRACTION TECHNIQUES;

TANTALUM;

EID: 85027930343 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-011-0358-1 Document Type: Article

Times cited : (31)

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