Improving the data reliability of measurement and control modules for distributed information-measuring systems

2017 IEEE 37th International Conference on Electronics and Nanotechnology, ELNANO 2017 - Proceedings

Volumn , Issue , 2017, Pages 523-526

  Kochan, Roman ^a   Sachenko, Anatoliy ^b,c   Kochan, Volodymyr ^b   Yanovsky, Maxim ^d   Kochan, Orest ^a   Kharchenko, Vyacheslav ^d  

^a LVIV POLYTECHNIC NATIONAL UNIVERSITY   (Ukraine)

^b TERNOPIL NATIONAL ECONOMIC UNIVERSITY   (Ukraine)

^c SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

^d NATIONAL AEROSPACE UNIVERSITY   (Ukraine)

Author keywords

analog To digital converter; complexity of the controls and reconfiguration; measurement and control modules; reliability; sensor data; survivability; veracity

Indexed keywords

ANALOG TO DIGITAL CONVERSION; NANOTECHNOLOGY; RELIABILITY;

ANALOG TO DIGITAL CONVERTERS; COMPLEXITY OF THE CONTROLS AND RECONFIGURATION; MEASUREMENT AND CONTROL; SENSOR DATA; SURVIVABILITY; VERACITY;

REDUNDANCY;

EID: 85021260283     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ELNANO.2017.7939806     Document Type: Conference Paper

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