Comment on “self-diffusion in silicon: Similarity between the properties of native point defects”

Physical Review Letters

Volumn 85, Issue 22, 2000, Pages 4835-

  Bracht, Hartmut ^a   Haller, Eugene E ^b  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85019404700     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.4835     Document Type: Article

References (3)

1. A. Ural; Phys. Rev. Lett. 83, 3454(1999).
2. H. Bracht; Phys. Rev. B 52, 16 542 (1995), and references therein.
3. H. Bracht; Phys. Rev. Lett. 81, 393 (1998).