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Volumn , Issue , 2006, Pages

Accelerated Quality and Reliability Solutions

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EID: 85013776707     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-0-08-044924-1.X5000-X     Document Type: Book
Times cited : (35)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.