Methodological aspects of the highenergy synchrotron X-ray diffraction technique for internal stress evaluation

Journal of Neutron Research

Volumn 9, Issue 2-4, 2001, Pages 495-501

  Wanner, Alexander ^a   Dunand, David C ^b  

^a UNIVERSITY OF STUTTGART   (Germany)

^b Northwestern University   (United States)

Author keywords

Grain size; Internal stress measurement; Monochromatic high energy X rays; Probe volume; X ray diffraction

Indexed keywords

EID: 85013597256     PISSN: 10238166     EISSN: 14772655     Source Type: Journal    
DOI: 10.1080/10238160108200182     Document Type: Article

References (5)

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3. Korsunsky, A.M. and Wells, K.E. (2000). Mater. Sci. Forum 321-323, 218.
4. Wanner, A. and Dunand, D.C. (2000). Mater. Res. Soc. Sympos. Proc. 590, 157.
5. Wanner, A. and Dunand, D.C. (2000). Metall. Mater. Trans. A 31A. 2949.