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Volumn 705, Issue , 2004, Pages 1299-1302
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Large-area phase-contrast X-ray imaging system using a two-crystal X-ray interferometer - Development of an interference-pattern-based feedback positioning system
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HITACHI LTD
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 85012299281
PISSN: 0094243X
EISSN: 15517616
Source Type: Conference Proceeding
DOI: 10.1063/1.1758039 Document Type: Conference Paper |
Times cited : (16)
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References (13)
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