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Volumn 705, Issue , 2004, Pages 1299-1302

Large-area phase-contrast X-ray imaging system using a two-crystal X-ray interferometer - Development of an interference-pattern-based feedback positioning system

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Indexed keywords


EID: 85012299281     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1758039     Document Type: Conference Paper
Times cited : (16)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.