Operation of a separated-type x-ray interferometer for phase-contrast x-ray imaging

Review of Scientific Instruments

Volumn 70, Issue 12, 1999, Pages 4582-4586

  Yoneyama, Akio ^a   Momose, Atsushi ^a   Seya, Eiichi ^a   Hirano, Keiichi ^b   Takeda, Tohoru ^c   Itai, Yuji ^c  

^a HITACHI LTD   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^c UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001691441     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150116     Document Type: Article

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