ALS beamline 6.0 for ultrafast X-ray absorption spectroscopy

AIP Conference Proceedings

Volumn 705, Issue , 2004, Pages 1407-1410

  Heimann, P A ^a   Padmore, H A ^a   Schoenlein, R W ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85012266390     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1758065     Document Type: Conference Paper

References (8)

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2. Saes, M., Bressler, C., Abela, R., Grolimund, D., Johnson, S.L., Heimann, P.A., Chergui, M., Phys. Rev. Lett. 90, 047403-1-4 (2003).
3. Schoenlein, R.W., Chattopadhyay, S., Chong, H.H.W., Glover, T.E., Heimann, P.A., Shank, C.V., Zholents, A.A., Zolotorev, M.S., Science 287, 2237-2240 (2000).
4. http://www-als.lbl.gov/als/SRparameters.html.
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6. Lowney, D.P., Heimann, P.A., Gullikson, E.M., MacPhee, A.G., Falcone, R.W., Padmore, H.A., SPIE Proceedings 5194b, (2003).
7. Electromagnetic Theory of Gratings, edited by R. Petit, Springer-Verlag, Berlin, 1980.
8. Sanchez del Rio, M., and Dejus, R. J., SPIE Proceedings 3152, 148-157 (1997).