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Volumn 705, Issue , 2004, Pages 312-315

LUCIA - A new 1-7 keV μ-XAS beamline

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[No Author keywords available]

Indexed keywords


EID: 85012263431     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1757796     Document Type: Conference Paper
Times cited : (6)

References (6)
  • 1
    • 85012248653 scopus 로고    scopus 로고
    • Proposal (collaboration Ch-F): μ-XAS in soft x-ray regime
    • A. Scheidegger et al., Proposal (collaboration Ch-F): μ-XAS in soft x-ray regime, PSI, 2001.
    • (2001) PSI
    • Scheidegger, A.1
  • 3
    • 0001871691 scopus 로고    scopus 로고
    • Application of polarized EXAFS to fine-grained layered mineral
    • D. G. Schulze, J. W. Stucki, and P. M. Bertsch, Eds.), The Clay Mineral Society
    • A. Manceau et al., Application of polarized EXAFS to fine-grained layered minerals, in Synchrotron X-Ray Methods in Clay Science (D. G. Schulze, J. W. Stucki, and P. M. Bertsch, Eds.), The Clay Mineral Society, 1999.
    • (1999) Synchrotron X-Ray Methods in Clay Science
    • Manceau, A.1
  • 5
    • 85012290824 scopus 로고    scopus 로고
    • SLS frontends for insertion device beamlines
    • Q. Chen et al., SLS frontends for insertion device beamlines, PSI Scientific Report 1999, Volume VII.
    • (1999) PSI Scientific Report , vol.7
    • Chen, Q.1
  • 6
    • 0035763342 scopus 로고    scopus 로고
    • Submicron focusing of hard x-rays with reflecting surfaces at the ESRF
    • O. Hignette et al., Submicron focusing of hard x-rays with reflecting surfaces at the ESRF, SPIE Proc. 4499, 105-116 (2001).
    • (2001) SPIE Proc. , vol.4499 , pp. 105-116
    • Hignette, O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.