System-Level Electric Field Exposure Assessment by the Fault Tree Analysis

IEEE Transactions on Electromagnetic Compatibility

Volumn 59, Issue 4, 2017, Pages 1095-1102

  Jin, Lijun ^a   Peng, Chenyi ^a   Jiang, Tao ^a,b  

^a TONGJI UNIVERSITY   (China)

^b Chint Electrical Co Ltd   (China)

Author keywords

Electric field; exposure assessment; fault tree analysis; reliability; substation

Indexed keywords

BUILDING COMPONENTS; ELECTRIC FIELDS; ELECTRIC SUBSTATIONS; RELIABILITY ANALYSIS; TREES (MATHEMATICS);

BOUNDED PARAMETERS; COMPONENT LEVELS; FAILURE PROBABILITY; FIELD DISTRIBUTION; FIELD EXPOSURE; MOVING PEOPLES; SERIES-PARALLEL SYSTEM; SYSTEM LEVELS;

FAULT TREE ANALYSIS;

EID: 85010210722     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2017.2647961     Document Type: Article

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