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Volumn 123, Issue 2, 2003, Pages 129-132

Technical Trend of Environment-friendly High Voltage Vacuum Circuit Breaker (VCB)

Author keywords

environment friendly; high voltage; vacuum circuit breaker (VCB); vacuum interrupter (VI)

Indexed keywords


EID: 85010179095     PISSN: 03854213     EISSN: 13488147     Source Type: Journal    
DOI: 10.1541/ieejpes.123.129     Document Type: Article
Times cited : (21)

References (18)
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  • 8
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    • HV Dielectric Strength of Shiclding Electrodes in Vacuum Circuit-Breakers
    • S.Giere, M.Kurrat, and U.Schumann: “HV Dielectric Strength of Shiclding Electrodes in Vacuum Circuit-Breakers”, 20th ISDEIV, Tours, pp. 119–122 (2002)
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    • Giere, S.1    Kurrat, M.2    Schumann, U.3
  • 10
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    • Breaking Performance of a Capacitive- Graded Series Design of Two 24-kV Vacuum Circuit Breakers
    • thISDEIV, Tours, pp. 360–363 (2002)
    • (2002) thISDEIV, Tours , pp. 360-363
    • Fugel, T.1    Koenig, D.2
  • 12
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    • Improving Withstand Voltage by Roughening the Surface of an Insulating Spacer in Vacuum
    • O.Yamamoto, T.Takuma, M.Fukuda, and S.Nagata: “Improving Withstand Voltage by Roughening the Surface of an Insulating Spacer in Vacuum”, 20th ISDEIV. Tours, pp. 71–74 (2002)
    • (2002) 20th ISDEIV. Tours , pp. 71-74
    • Yamamoto, O.1    Takuma, T.2    Fukuda, M.3    Nagata, S.4
  • 13
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    • Area Effect on Electrical Breakdown of Copper and Stainless Steel Electrodes in Vacuum
    • M.Okawa, T.Shioiri, H.Okubo, and S.Yanabu: “Area Effect on Electrical Breakdown of Copper and Stainless Steel Electrodes in Vacuum”, IEEE Trans. Electrical Insulation, 23, No. 1. pp. 77–83 (1988)
    • (1988) IEEE Trans. Electrical Insulation , vol.23 , Issue.1 , pp. 77-83
    • Okawa, M.1    Shioiri, T.2    Okubo, H.3    Yanabu, S.4
  • 14
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    • Charging Characteristics and Electric Field Distribution on Alumina as Affected by Triple Junction in Vacuum
    • Y.Yamano, S.Ito, K.Kato. H.Okubo, and Y.Hakamata: “Charging Characteristics and Electric Field Distribution on Alumina as Affected by Triple Junction in Vacuum”. IEEE Trans. DEI, 9, No. 2, pp. 173–177 (2002)
    • (2002) IEEE Trans. DEI , vol.9 , Issue.2 , pp. 173-177
    • Yamano, Y.1    Ito, S.2    Kato, K.3    Okubo, H.4    Hakamata, Y.5
  • 15
    • 0036397768 scopus 로고    scopus 로고
    • Vacuum Electrical Breakdown Characteristics of Oxygen-free Copper Electrodes Processed by Precision Machining
    • T.Otsuka, Y.Yamano, and S.Kobayashi: “Vacuum Electrical Breakdown Characteristics of Oxygen-free Copper Electrodes Processed by Precision Machining”. 20th ISDEIV, Tours, pp. 556–559 (2002)
    • (2002) 20th ISDEIV, Tours , pp. 556-559
    • Otsuka, T.1    Yamano, Y.2    Kobayashi, S.3
  • 16
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    • Impulse Breakdown Conditioning Process under Non-uniform Electric Field in Vacuum
    • H.Okubo, H.Wanibe, F.Miyazaki, K.Kalo, and T.Shioiri: “Impulse Breakdown Conditioning Process under Non-uniform Electric Field in Vacuum”, 20th ISDEIV. Tours, pp. 335–338 (2002)
    • (2002) 20th ISDEIV. Tours , pp. 335-338
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  • 17
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    • Real-time and Highspeed Measurement of Chargeing Processes on Dielectric Surface in Vacuum
    • K.Suzuki, K.Kato. Y.Hakamata. and H.Okubo: “Real-time and Highspeed Measurement of Chargeing Processes on Dielectric Surface in Vacuum”, 20th ISDEIV, Tours, pp. 227–230 (2002)
    • (2002) 20th ISDEIV, Tours , pp. 227-230
    • Suzuki, K.1    Kato, K.2    Hakamata, Y.3    Okubo, H.4
  • 18
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    • Influence of Electrode Arrangement and Gap Length on V-t Characteristics of Vacuum Gaps
    • 10, (in Japanese)
    • S.Sato, K.Koyama, and H.Fujii: “Influence of Electrode Arrangement and Gap Length on V-t Characteristics of Vacuum Gaps”, T. IEE Japan, Vo.122-A, No. 10, pp. 891–897 (2002–10) (in Japanese)
    • (2002) T. IEE Japan , vol.122-A , Issue.10 , pp. 891-897
    • Sato, S.1    Koyama, K.2    Fujii, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.