Charging characteristics and electric field distribution on alumina as affected by triple junctions in vacuum

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 9, Issue 2, 2002, Pages 173-177

  Yamano, Y ^a   Ito, S ^a   Kato, K ^a   Okubo, H ^a   Hakamata, Y ^b  

^a NAGOYA UNIVERSITY   (Japan)

^b HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CATHODES; DIELECTRIC MATERIALS; ELECTRIC CHARGE; ELECTRIC CIRCUIT BREAKERS; ELECTRIC INSULATION; ELECTRON EMISSION; PROBLEM SOLVING; VACUUM APPLICATIONS;

CATHODE TRIPLE JUNCTION (CTJ); ELECTRIC FIELD DISTRIBUTION;

ELECTRIC FIELDS;

EID: 0036540427     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.993731     Document Type: Conference Paper

References (7)

1. Surface flashover of insulators
2. Flashover of insulators in vacuum
3. The effect of insulator charging on breakdown and conditioning
4. Surface charging and flashover on insulators in vacuum
5. Charging characteristics on dielectric surface by different charging processes in vacuum
6. Influence of electric field distribution on charging mechanism on alumina dielectrics by triple junction in vacuum