Displacement metrology with sub-pm resolution in air based on a fs-comb wavelength synthesizer

Optics Express

Volumn 14, Issue 13, 2006, Pages 5984-5993

  Schibli, T R ^a   Minoshima, K ^a   Bitou, Y ^a   Hong, F L ^a   Inaba, H ^a   Onae, A ^a   Matsumoto, H ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85010161431     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.005984     Document Type: Article

References (11)

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