Modeling and performance of a polarization active imager at λ=806 nm

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3707, Issue , 1999, Pages 449-460

  Breugnot, Sebastien ^a   Clemenceau, Philippe ^a  

^a THALES   (France)

Author keywords

Active imaging; Mueller matrix; Polarimetry; Polarization degree

Indexed keywords

MATRIX ALGEBRA; OPTICAL RADAR; POLARIMETERS; POLARIZATION; RADAR; SEMICONDUCTOR LASERS;

ACTIVE IMAGING; CCD MATRIX; DUAL IMAGE; EXPERIMENTAL VALIDATIONS; MONOSTATIC; MUELLER MATRIX; POLARIZATION DEGREE;

LASER APPLICATIONS;

EID: 85010099570     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.351366     Document Type: Conference Paper

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