Surface rugosity and polarimetric analysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2782, Issue , 2004, Pages 719-729

  Elies, Philippe ^a   Le Jeune, Bernard ^a   Marie, Jean Pierre ^a   Cariou, Jack ^a   Lotrian, Jean ^a  

^a UNIVERSITÉ DE BRETAGNE OCCIDENTALE   (France)

Author keywords

Mueller matrix; Poincare Sphere; Polarization; Surface rugosity

Indexed keywords

TRANSFER MATRIX METHOD;

ANGLES OF INCIDENCE; DEGREE OF POLARIZATION; MUELLER MATRIX; POINCARE SPHERE; POLARIMETRIC ANALYSIS; POLARIZATION PROPERTIES; POLARIZATION TRANSFORMATION; STATISTICAL EFFECTS;

POLARIZATION;

EID: 78951491216     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.250804     Document Type: Conference Paper

References (4)

1. B. Le Jeune, J.P. Marie, P.Y. Gerligand, J. Cariou and J. Lotrian, "Mueller matrix formalism in imagery. An experimental arrangement for noise reduction", Proceeding vol. 2265 of SPIE, International Symposium on Optic, Imaging and Instrumentation, San Diego (U.S.), 443-451, (1994).
2. J. J. Gil and E. Bernabeu, "Depolarization and polarization indices of an optical system", Optica Acta, Vol. 33, No2, pp. 185-189, 1986.
3. Garcia Weidner A., "The Poincaré sphere : isolated and real trajectories describing the state of polarization", J. Optics (Paris), Vol 23(1), pp 3-12 (1992).
4. F. Le Roy-Bréhonnet, B. Le Jeune , P. Eliès, J. Cariou and J. Lotrian "Optical media and target characterization by Mueller matrix decomposition", J. Phys. D Appl.Phys. 29 (1996) 34-38.