Spectral knowledge (SK-UTALCA): Software for exploratory analysis of high-resolution spectral reflectance data on plant breeding

Frontiers in Plant Science

Volumn 7, Issue , 2017, Pages

  Lobos, Gustavo A ^a   Poblete Echeverría, Carlos ^b,c  

^a UNIVERSIDAD DE TALCA   (Chile)

^b PONTIFICIA UNIVERSIDAD CATÓLICA DE VALPARAÍSO   (Chile)

^c STELLENBOSCH UNIVERSITY   (South Africa)

Author keywords

Collinearity; Noise; Outlier; Phenomic; Phenotyping; Scan; Spectral reflectance index (SRI); Wavelength

Indexed keywords

EID: 85009798940     PISSN: None     EISSN: 1664462X     Source Type: Journal    
DOI: 10.3389/fpls.2016.01996     Document Type: Article

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