The Growth Of Si Nanowires In UHVTEM And Cs-corrected ETEM

Microscopy and Microanalysis

Volumn 18, Issue S2, 2012, Pages 1084-1085

  Chou, Yi Chia ^a   Reuter, M C ^b   Stach, E A ^a,c   Ross, F M ^b  

^a PURDUE UNIVERSITY   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85009580365     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612007271     Document Type: Article

References (6)

1. F.M. Ross, Reports on Progress in Physics 73 (2010) 114501.
2. C.-Y. Wen et al., Physical Review Letters 105 (2010) 195502.
3. C.-Y. Wen et al., Physical Review Letters 107 (2011) 025503.
4. Y.-C. Chou et al., submitted (2012).
5. C.-Y. Wen et al., Science 326 (2009) 1247.
6. S. Hofmann et al., Nature Materials 7 (2009) 372.