Quantitative Analysis of Atomic-Resolution X-ray Maps in an Aberration- Corrected Scanning Transmission Electron Microscope with a Large Solid- Angle Detector

Microscopy and Microanalysis

Volumn 18, Issue , 2012, Pages 974-975

  Watanabe, M ^a   Yasuhara, A ^b   Okunishi, E ^b  

^a Lehigh University   (United States)

^b JEOL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85008560226     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612006721     Document Type: Article

References (4)

1. S.J. Pennycook & P.D. Nellist ed. Scanning Transmission Electron Microscopy: Imaging and Analysis, Springer, NY, (2011).
2. H.S. von Harrach, et al., Microsc. Microana. 15 (2009), Suppl. 2, 208.
3. M. Watanabe and D.B. Williams, J. Microsc. 221 (2006), 89.
4. M. Watanabe et al., Microsc. Anal., 23 (2009), Issue 7, 5.